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E3/E4 Initiative

Starting January 2001, top 3 European semiconductor device manufacturers: STMicroelectronics, Philips Semiconductors and Infineon Technologies are working together in the E3 (Environmental 3) Initiative to promote standardization, methodologies and a common roadmap towards Lead-free electronics. Since June 3rd 2004 the Initiative is extended to Freescale Semiconductors; it is now named E4 (Environmental 4).



Aim of E4 is to provide high quality drop-in solutions for Lead-free applications to all Customers of the E4 members. E4 will share databases and methodologies, collaborate on standards and develop a common conversion strategy for the transition to Lead-free.



9 common documents have been published on Lead-free Matte Tin plated components and on whisker risk prevention:

E3 Tin Whisker Formation - Results, Test Methods and Countermeasures

E3 Whisker Root Cause and Respective Test Conditions

E3 Data on solderability of leadfree parts

E3 Data on whiskers for parts done with Cu

E3 Lead-free Presentation

E3 Whiskers data for AL42 frames

E4 Sn plating in respect to proposed NEMI test conditions

E4 Whisker Formation on Tin Plated Cu based Leadframes

E4 Whisker Formation on Tin Plated FeNi42

E4 Lead-free packaging for Semiconductor Devices



 

 

Whisker Formation  

Whisker on Lead-free platings

Whiskers testing: Reality or Fiction?

Pure Tin Plating Qualification

 

 

Product/Process Change Notification



PCN Code                 
PCN Reference
Insertion Date
4
PCSR2003004
31-Oct-03
5
PCSR2003005
6-Nov-03
DSG-COM/03/145
24-Jan-03
322
DSG-DIS/03/322
28-Aug ,2003
DSG/03/288
13- Oct-2003
346
DSG/03/346
14-Oct-03
368
DSG/03/368
27-Nov-03
380
DSG/03/380
28-Nov-03
391
DSG-COM/03/391
11-Dec-03
451
MPG EEP/04/451
12-Feb-04
457
CMG-IMG/04/457
26-Feb-04
493
CMG-TVD/04 493
16-Apr-2004
MPG EEP/04/578
28-Jun-04
635
CMG-TVD/04/635
20-Jul-,2004
634
CMG-TVD/04/634
20-Jul-2004
651
CMG-TVD/04/651
23-Jul-2004
677
CMG-TVD/04/677
08-Sep-2004
678
CMG-TVD/04/678
8-Oct-04
679
CMG-TVD/04/679
8-Oct-04
683
CMG-TVD/04/683
8-Oct-04
CMG-TVD/04/742
10-May-04
743
CMG-TVD/04/743
10-Jun-04
744
CRP 04/744
8-Nov-2004
PIL 1014 MOLDING MATERIAL IMPROVEMENT FOR SO NARROW PREPLATED PACKAGES
20-May-2005
PCN 1015 SUBSTRATE METALLISATION AND LEAD FREE SOLDER BALLS CHANGE FOR BGA PACKAGES WITH SIZE EQUAL OR BELOW 23X23
20-May-2005

 

 

Product/Process Information Letter

PIL Reference 

PIL Title

  
LEADFREE COMPONENTS CONNECTIONS
New Format for Standard Label Inner box (“bulk”)

  

 

 

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