Since the 70’s ST has invested significantly in designing and development of stress-test equipment for new device qualifications, to achieve:
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Total simulation of the field operating conditions for smart power devices |
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Full coverage stress-test pattern for digital devices |
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The main features of this equipment are:
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Complete compliance with the reference international standards for IC qualification (MIL, JEDEC, AEC Q100, etc.) |
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Mixed and digital device driving capability
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Wide power, temperature and humidity ranges |
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Real-time analog and digital monitoring |
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