The 55V "N" series comes from the multi-drain
approach now applied to the low voltage technology in
order to significantly reduce the R
DS(on)
per area.
TO-220 versions (STP180N55F3 and STP185N55F3) will soon
be introduced. The next step is to develop a 55V line
in the DPAK package in order to achieve an R
DS(on)
typical value in the range of 8.0mOhm.
The comparison between the 55V device in both STripFET
II and MDmesh low voltage technologies is shown below.
The R
DS(on) x area for the new "N" series
versus the previous NF series, is around 40% lower.
That is, the "N" series provides the same R
DS(on)
value with 40% less silicon area.

Typical RDS(on) x area of N series versus NF series