
175°C operating temperature

Standard threshold drive

Typical R
DS(on) in the range of 5mOhm

100% avalanche rated

AEC Q101 compliant

P.A.T (part average testing) applied during wafer probing
This series is a direct spin-off of the successful STripFET III technology.This further enhancement of the ST’s low voltage range has been optimized for automotive applications, addressing V
(BR)DSS ranging from 30V to 40V. A further optimization will bring devices ranging from 50V to 75V in order to achieve for these BV
DSS values the best R
DS(on) performance for D
2PAK and DPAK in the market.
Thanks to this technology release it is now possible
for ST to be extremely competitive in terms of R
DS(on)
and cost performance. In fact the new “N...F3”
series offer devices with a 30% reduction of silicon
area to ensure the same R
DS(on) of the previous
“NF” series.
With the same silicon area the "N...F3"
series shows a reduction of RDS(on) of
about 30% with respect to the NF series