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Microcontrollers for Automotive
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16-bit Microcontrollers for Automotive
16-bit MCUs with 512/768/832 KByte Flash and 36/36/68 KByte RAM memories
Errata Sheet
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Last Updated: 18/09/2007
Pages: 18
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16-bit MCU with 512 Kbyte Flash memory and 36 Kbyte RAM
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ST10F276E, ST10F275E, ST10F273E Errata sheet
16-bit MCUs with 512/768/832 KByte Flash and 36/36/68 KByte RAM memories
Introduction
This errata sheet describes all the functional and electrical problems known in the Cxx silicon versions of the ST10F276E, ST10F275E and ST10F273E. Note: The ST10F275E and ST10F273E are commercial products based on the same silicon as the ST10F276E. Therefore the present document is valid for all the three devices. The major revision of the device can be read in the IDCHIP register (@F07Ch) which is set to 1143h for the Cxx versions.
September 2007
Rev 8
1/18
www.st.com
Functional problems' summary
ST10F276E, ST10F275E, ST10F273E
1
1.1
Functional problems' summary
Functional's problem summary for the CAA version
Table 1. Functional problems of the ST10F276E, F275E and F273E CAA version
Short description ADC accuracy degradation Injected conversion stalling the ADC Spurious BREQ pulse in slave mode during external bus arbitration phase Concurrent transmission requests in DAR-mode Disabling of transmission request Read While Write not supported Flash access time P2.0 activity and Flash operations XFlash access and wait-state Bit protection not implemented on the CAPCOM IOs of ports P2, P7 and P8 Execution of PWRDN Instruction High current consumption in Power Down Mode Software and Watchdog reset malfunction XASC Receive Overrun Error Flag not set Corruption of XPWM register on read access Consecutive write accesses to the XPWM module not performed XSSC Receive Error Flag not set Functional problem ADC.1 ADC.2 BUS.9 C-CAN.1 C-CAN.2 FLASH.1 FLASH.4 FLASH.6 FLASH.7 PORT.1 PWRDN.1 PWRDN.2 RESET.1 XASC.1 XBUS.3 XPWM.1 XSSC.1
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ST10F276E, ST10F275E, ST10F273E
Functional problems' summary
1.2
Functional's problem summary for the CEA version
Table 2. Functional problems of the ST10F276E, F275E and F273E CEA version
Short description Injected conversion stalling the ADC Spurious BREQ pulse in slave mode during external bus arbitration phase Concurrent transmission requests in DAR-mode Disabling of transmission request Read While Write not supported Execution of PWRDN Instruction XASC Receive Overrun Error Flag not set XSSC Receive Error Flag not set Functional problem ADC.2 BUS.9 C-CAN.1 C-CAN.2 FLASH.1 PWRDN.1 XASC.1 XSSC.1
1.3
Functional's problem summary for the CEG version
Table 3. Functional problems of the ST10F276E, F275E and F273E CEG version
Short description Injected conversion stalling the ADC Spurious BREQ pulse in slave mode during external bus arbitration phase Concurrent transmission requests in DAR-mode Disabling of transmission request Read While Write not supported Execution of PWRDN Instruction Functional problem ADC.2 BUS.9 C-CAN.1 C-CAN.2 FLASH.1 PWRDN.1
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Functional problems description
ST10F276E, ST10F275E, ST10F273E
2
2.1
Functional problems description
ADC.1 - ADC accuracy degradation
On specific analog input values an accuracy degradation of several LSBs may be seen on the digital output value of the implemented ADC. In particular this occurs if the input voltage matches the internal comparator thresholds, which is when a roll over from the least significant bits (i.e. 0x1Fh -> 0x20h or vice versa) occurs. The maximum deviation in accuracy is 250mV over the entire conversion range.
Additional information:
The failure is linked to the implemented "self calibrating circuitry" which is summarized in the Figure 1: Calibration mechanism (during bit 9 comparison phase). The maximum correction applied by the calibration is 250mV. When the analog input voltage is close to one of the thresholds of the comparator (by less than 1mV), then the amplifier sees a differential voltage very close to zero. As a result, the output of the comparator will be fluctuating between the values "0" or "1". Because of the parallel use of the comparator output and of the fluctuating value, different values may be latched in the SAR (Successive Approximation Register) and the Calibration section. As a result a bad calibration mechanism is applied to the successive bit Figure 1. Calibration mechanism (during bit 9 comparison phase)
VR + C9 VAREF VAIN VAGND VAREF 1 0 VAGND C8 ... C4 C 4a CSH CCAL VAREF COUT
SAR
ACCUMULATOR
+ VAGND :
C4a C4 C5 C6 C7 C8 C9
CAL. REGISTERS
Application hints - containment strategy:
Measurements on different pieces and over several billions conversions have been made. The results are showing an error rate of 1/600,000.
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ST10F276E, ST10F275E, ST10F273E
Functional problems description
Workaround:
It is not possible to define a workaround generic for all applications.
2.2
ADC.2 - Injected conversion stalling the ADC
Description
Whenever a new Injection request is issued before the ADDAT2 register has been read by the CPU (i.e. the result of the previous injection request was not read), the ADC is stalled and no further conversions are performed.
Workarounds - Recovery actions
The following actions allows to unlock the ADC module: 1. 2. Read the ADDAT2 register twice at the end of every injected conversion (also prevents stall condition to occur) Disable then re-enable the Wait For Read mode
Application conditions
In an application, all the following conditions are needed to reach this state:
Injection requests are hardware triggered (via CapCom CC31) The result of injected conversion are read via a PEC transfer (prevents from reading twice ADDAT2 by software) A high level task is disabling the PEC transfer for a long time (2 analog conversion + time between 2 injection requests)
Therefore ensuring, at application level, that no task can disable interrupts for a time such than 2 injection requests can be issued before a read operation is performed prevents the locking situation to occur.
Detailed analysis
Channel Injection Mode allows the conversion of a specific analog channel (also while the ADC is running in a continuous or auto scan mode) without changing the current operating mode. The following main points need to be highlighted:
Wait for ADDAT Read Mode is needed in order for the ADC Channel Injection mode to properly operate At the end of the Injected conversion the data will be available in the alternate result register ADDAT2 and a Channel Injection Complete Interrupt request will be generated (ADEIR Flag) If the temporary data register used for ADDAT2 Read Mode is full, the respective next conversion (standard or Injected) will be suspended. The temporary register can hold data for ADDAT (from a standard Conversion) or for ADDAT2 (from an injected conversion)
If the temporary data register used for ADDAT2 Read Mode is full and a new Injection request is issued then the new converted value is stored into a temporary data register until the previous one is read from ADDAT2.
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Functional problems description
ST10F276E, ST10F275E, ST10F273E
For a correct functionality as soon as ADDAT2 register is read then the last converted value should be moved from temporary register to ADDAT2 and the ADEINT interrupt request should be issued. This would allow the CPU to read the last converted value. See Figure 2. In the real situation as soon as ADDAT2 register is read then the last converted value is correctly moved from temporary register to ADDAT2 but the ADEINT interrupt request is not received by the Interrupt Controller (see Figure 3). As a consequence the CPU/PEC will never know that a new converted value is ready to be read in ADDAT2 register and therefore at the following injection request the ADC will fill the temporary register again (without generating any ADEINT interrupt request) and then will stall the ADC for any further conversion. The ADC will stay in the "wait for read ADDAT2 register" condition forever. Figure 2. ADC injection theoretical operation
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ST10F276E, ST10F275E, ST10F273E Figure 3. ADC injection actual operation
Functional problems description
ADEINT Interrupt not generated ADDAT2 correctly updated and can be read by software
2.3
BUS.9 - Spurious BREQ pulse in slave mode during external bus arbitration phase
When using external bus arbitration via HOLD-function with the ST10F276 configured as a slave, sporadic bus errors may occurs. After the slave has been granted the bus, the slave deactivates BREQ sporadically for a short time, even though the bus access of the slave has not been completed. The master then starts its own bus access, leading to a bus conflict between master and slave.
Workaround:
In order not to produce any spurious BREQ pulse during a Slave External Bus Arbitration Phase, it is necessary to guarantee that the distance between the HOLDA assertion (Bus Acknowledge from Master device) and the following HOLD falling edge (Bus Request from Master) is greater than three clock cycles. This can be implemented by delaying the HOLD signal with a RC circuit as shown in the figure below.
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Functional problems description Figure 4. ST10 in slave mode
ST10F276E, ST10F275E, ST10F273E
HOLD HLDA
BREQ (P6.7) HLDA (P6.6)
BREQ Master
VSS
HOLD (P6.5) ST10 in Slave mode
2.4
C-CAN.1 - Concurrent transmission requests in DAR-mode
Description:
When the C_CAN is configured to work in DAR-mode (Disable Automatic Retransmission) and the host requests the transmission of several messages at the same time, only two of these messages will be transmitted. For all other requested transmit messages, the TxRqst bits will be reset, but no transmission will be started, NewDat and IntPnd will be left unchanged. For the two messages that are transmitted, the TxRqst and NewDat bits will be reset and, if enabled by TxIE, IntPnd will be set. The normal operation mode (DAR = 0) is not affected by this phenomenon.
Workaround:
The DAR-mode is intended to support time triggered operation (TTCAN level 1), where a message may be transmitted only in its dedicated time window. It would be an error to request the transmission of several messages at the same time. So no workaround is necessary for TTCAN applications. The progress of a requested transmission can be monitored by checking the message object's TxRqst and NewDat [optionally IntPnd] bits. In DAR-Mode, a message that was requested to be transmitted, but that was not transmitted either because the transmission was disturbed or because the transmission was not started needs to be requested again.
2.5
C-CAN.2 - Disabling of the transmission request
Description:
When the host disables the pending transmission request of the message object with the lowest priority (number 32 in the default implementation) in the short time window where the message handler state machine has prepared the transmission of the message, but before the transmission has actually started, then the transmission request of this message object may remain stuck at disabled even if the host immediately re-enables it. Reading the transmission request bit of this message object will not show that it is stuck at disabled. This
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Functional problems description
can only happen when this message object is the only one with a pending transmission request. If the transmission request is stuck at disabled, it will be re-enabled by the first activity detected on the CAN bus or by setting the transmission request of any other message object. The other message objects are not affected by this phenomenon.
Workaround:
Generally, it is not necessary to disable the transmission request of a message object. If the message object is to be used for another message, it is sufficient to prepare the new content for this message object in the CPU interface register (Identifier, DLC, Data, with TxRqst and NewDat [optionally TxIE] bits) and to transfer this content into the message object. The new content will be transmitted at the next opportunity, not influenced by a possibly ongoing transmission of the previous content of the same message object.
2.6
FLASH.1 - Read while Write not supported
The read while write functionality is not supported with this silicon version: a write operation in one of the four banks prevents subsequent reading from the Flash (whatever XFlash or IFlash) till it is completed. The reason of this limitation has been found and will be corrected in a future silicon version.
Workaround:
Flash programming / reprogramming routines must be executed from RAM.
2.7
FLASH.4 - Flash access time
Preliminary characterization data are showing limitations on Flash access time for CPU clock frequency above 40MHz. This can result in erroneous data read from the IFlash or the XFlash for operand accesses or in illegal opcode for opcode accesses.
Workaround:
To have functional parts in the whole -40 / 125 degree Celsius range, limit the CPU clock frequency to 40MHz. There is no workaround for higher CPU clock frequencies.
2.8
FLASH.6 - P2.0 activity and Flash operations
Activity on pin P2.0 could cause failures during the Flash fetch, read or erase operations. The source of the activity can be external hardware or internal pin activity. This applies when P2.0 is:
configured in input and connected to a dynamic signal, configured in output compare mode or software controlled output.
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Functional problems description
ST10F276E, ST10F275E, ST10F273E
Workaround:
For fetch and read operations:
When P2.0 is configured as input, connect it to ground. When P2.0 is configured as output: for CPU frequency up to 40MHz, the minimum time between two transitions of the signal must be 90 us; for CPU frequency higher than 40MHz, use P2.0 in static way.
For erase operations: use the pin P2.0 in a static way (input or output).
2.9
FLASH.7 - XFlash access and wait-state
Preliminary characterization data are showing limitations on XFlash access time for CPU clock frequency above 35MHz with 0 wait-state (see register XFICR programming).
Workaround:
For CPU frequencies above 35MHz, configure XFICR to have 1 wait-state. Note that the default value of the XFICR after reset is such that 15 wait-states are used to access the XFlash.
2.10
PORT.1 - Bit protection not implemented on the CAPCOM IOs of ports P2, P7 and P8
The ST10F276-5-3E provides protected bits. These bits can be modified by both the on-chip hardware and the software. This is the case of the Port registers when Alternate functions are in use. The protection ensures that these bits are not modified when the software accesses to other bits of the register. The Capture Compare Unit (simply CAPCOM) can make a port pin toggle automatically via compare match. If the toggling event occurs during a software modify or write-back operation using any bit manipulation instruction (BSET/CLR, BFLDH/L, BAND,...), performed on another bit of the same port (same data register Px), then the toggling event is overwritten by the write-back. These bits are the ones related to Port Data registers where the CAPCOM output alternate functions are mapped, see Table 4. Table 4. List of the bits affected by the PORT.1 problem
Affected bit P2.0 to P2.15 P7.4 to P7.7 P8.0 to P8.7 Alternate function CC0IO to CC15IO CC28IO to CC32IO CC16IO to CC23IO
Port register Por t2 Por t7 Por t8
Workaround 1: Application mapping
Map the application IOs in order not to mix outputs controlled by software on one of those ports when a Compare output is used.
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ST10F276E, ST10F275E, ST10F273E
Functional problems description
Workaround 2: Software toggling of the Compare output
Instead of using the hardware toggling of the bit, generate an interrupt at each Compare output match. Then inside the interrupt routine a safe port bit manipulation can be performed.
2.11
PWRDN.1 - Execution of PWRDN instruction
When instruction PWRDN is executed while pin NMI is at a high level (if PWDCFG bit is cleared in SYSCON register) or while at least one of the port P2 pins used to exit from Power Down mode (if PWDCFG bit is set in SYSCON register) is at the active level, Power Down mode is not entered, and the PWRDN instruction is ignored. However, under the conditions described below, the PWRDN instruction is not ignored, and no further instructions are fetched from external memory, i.e. the CPU is in a quasi-idle state. This problem only occurs in the following situations: a) The instructions following the PWRDN instruction are located in an external memory, and a multiplexed bus configuration with memory tristate waitstate (bit MTTCx = 0) is used. The instruction preceding the PWRDN instruction writes to external memory or an XPeripheral (XRAM, CAN, etc.), and the instructions following the PWRDN instruction are located in external memory. In this case, the problem occurs for any bus configuration.
Or b)
Note:
The on-chip peripherals are still working correctly, in particular the Watchdog Timer, if not disabled, resets the device upon an overflow. Interrupts and PEC transfers, however, cannot be processed. In case NMI is asserted low while the device is in this quasi-idle state, Power Down mode is entered. No problem occurs if the NMI pin is low (if PWDCFG = 0) or if all P2 pins used to exit from Power Down mode are at inactive level (if PWDCFG = 1): the chip normally enters Power Down mode.
Workaround:
Ensure that no instruction that writes to external memory or to an XPeripheral precedes the PWRDN instruction, otherwise insert a NOP instruction in front of PWRDN. When a multiplexed bus with memory tristate wait state is used, the PWRDN instruction must be executed from internal RAM or XRAM.
2.12
PWRDN.2 - High current consumption in Power Down mode
When the PWRDN instruction is executed from the Flash (whatever XFlash or IFlash), the Flash is not correctly switched off, leading to a current consumption above the specifications. Moreover, as the XRAM2 and the XFlash are sharing the same XBus chip select, the same behavior occurs when executing the instruction from XRAM2.
Workaround:
Execute the PWRDN instruction from IRAM or XRAM1.
11/18
Functional problems description
ST10F276E, ST10F275E, ST10F273E
2.13
RESET.1 - Software and watchdog reset malfunction
The Software reset instruction (SRST) and the Watchdog reset may not be correctly recognized by the Flash controller. As a consequence the Flash controller maintains the ST10 under reset leading to a dead-lock situation.
Workaround:
If the SRST instruction or the watchdog reset are used in the application then the SYSCON register must be configured to activate the bidirectional reset feature and allow the Flash Controller to detect a low level on the RSTIN pin. Provided that the RPD pin level will remain high for the whole reset duration, the reset will not turn into a hardware reset and the flags in the WDTCON register will be set as before. To achieve a correct behavior the following constraints must be considered: 1. 2. 3. 4. The circuitry on RSTIN pin must be compatible with the use of the bidirectional reset. RSTIN discharge time must be shorter than the internal Reset duration of 512 CPU clock cycles. RPD pin discharge time must be longer than the time the RSTIN pin is seen at a low level by the ST10F276. RSTIN pulse (low level active) duration must be longer than the PLL Lock Time, in case an unlock occurred.
Application example:
The following values for RC circuitries on the RPD and RSTIN pins have been simulated and are matching the previous constraints.
RPD RC circuit:RSTIN RC circuit:
R = 215 kohm C = 100 nF R = 215 kohm (pull-up to VDD) C = 10 nF (between RSTIN and VSS)
Impact on the Alternate Bootstrap Mode:
The Alternate Boot Mode is affected by this functional problem. When the User key is correctly programmed into the Flash, a Software Reset instruction is executed in order to restart the ST10F276 in normal mode and to run the application software.
2.14
XASC.1 - XASC receive overrun error flag not set
In the ST10's XASC, data reception is double buffered, so that reception of a second character may begin before the previously received data has been read out of the receive buffer register (XS1RBUF). The overrun error flag (S1OE, bit 10 of XS1CON register) and an error interrupt request flag will be set when the receive buffer has not been read out before the completion of the second reception. In the condition where the XS1RBUF register content is read out at the completion of the second reception, the XS1RBUF register content is updated and the new data is read out without the flags being set.
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ST10F276E, ST10F275E, ST10F273E
Functional problems description
Workaround:
The real time behavior of the application must be checked. The polling rate of the XASC Receive Interrupt Request flag or the priority of the XASC Receive Interrupt must be increased in order to ensure the reading of the XS1RBUF before the end of the next transfer.
2.15
XBUS.3 - Corruption of XPWM register on read access
If, fetching from IFlash, a write to XRAM is performed and followed immediately (two MOV instructions in sequence) by a read from a XPWM register, then the XPWM register is corrupted (spurious write) with the content of the data previously written in XRAM.
Workaround:
Inser t a NOP instruction before all read accesses to the XPWM module.
2.16
XPWM.1 - Consecutive write accesses to the XPWM module
When both following conditions are met: a) AND b) two (or more) consecutive write operations are executed with XPWM registers as target code is executed from IFlash
Then only the first write operation is performed: the others are not performed.
Workaround:
Add four NOP instructions between two write accesses to XPWM registers.
2.17
XSSC.1 - XSSC receive error flag not set
In the following conditions:
2 data (Data_A and Data_B) are consecutively received on the XSSC the XSSC Receive Buffer (XSSCRB) is read (by the CPU) at the end of the reception of the second data
Then the XSSCRB register content is updated with Data_B by the XSSC module. The Data_A is lost and the Receive Error Flag is not set in the XSSCCON register. As the reception of the Data_B sets the XSSC Receive Interrupt Flag, the CPU will read Data_B as the second data received. Therefore Data_B will be read twice with no error flag.
Additional information:
The item is valid in both master and slave modes. This is impacting the application when transmissions are made consecutively without stopping the clock as described below.
13/18
Functional problems description
ST10F276E, ST10F275E, ST10F273E
To initiate the clock, a dummy transmission is made by the master: i.e. the application code writes to the XSSCTB (transmit buffer) and a clock is generated, data is received along with this clock. When several data are to be received, generally the application uses the XSSC Transmit Interrupt Request flag. As soon as the XSSCTB has been transferred to the shift register, the XSSC Transmit Interrupt Request flag is set to indicate that the XSSCTB can be reloaded again. This gives the fastest transmission as a continuous clock is provided to the slave. The application checks the XSSC Receive Interrupt Request flag to read the received value and a new reception is on going during the effective reading of XSSCRB register.
Workaround:
When the ST10's XSSC is in master mode, do not use continuous transfer sequences. Instead wait for the complete reception of each data, using the XSSC Receive Interrupt Request flag before starting a new reception. When the ST10's XSSC is in slave mode (or in master mode), the real time behavior of the application must be checked. The polling rate of the XSSC Receive Interrupt Request flag or the priority of the XSSC Interrupt must be increased in order to ensure the reading of the XSSCRB before the end of the next transfer.
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ST10F276E, ST10F275E, ST10F273E
Documentation update - Modifications of features
3
Documentation update - Modifications of features
Previous references: ST10F276 Preliminary Data, Revision 1.2, January 2005 ST10F276 User Manual, Release 1.6, January 2005 New references: ST10F276E Data sheet, Revision 1, May 2006 ST10F273E Data sheet, Revision 1, May 2006 ST10F276 User Manual, Release 1, March 2007
3.1
Flash commands timings updated
Characterization and validation results were showing that the typical programming and erasing times for the Flash are longer than the original specified values. This point was formerly described as FLASH.3 functional problem.
Specification change:
Timings for erase and programing are now fully specified in the devices' data sheets.
3.2
Main Voltage regulator must be OFF in Power Down
Characterization and validation results show that the main voltage regulator must be switched off during Power Down to meet power consumption specification and avoid possible CPU wake-up. This point was formerly described as PWRDN.3 functional problem.
Specification change:
The main voltage regulator must be turned off in Power Down by setting bit VREGOFF in XMISC register (bit XMISC.3). Setting this bit will automatically turn-off the main voltage regulator after the Power Down instruction is executed and will turn it up again when leaving Power Down mode.
3.3
DC and AC parameters modifications
The following parameters were formerly highlighted as out of the target specifications. They have been re-specified in the revision 1.2 of the Preliminary Data. VHYS (Input Hysteresis in TTL threshold): this parameter is re-specified to 400mV instead of 500mV. ISB1 (Stand-by mode current with RTC off, Oscillator off and VDD off): for temperature within 105 / 125 degree Celsius this parameter is re-specified to 500uA instead of 200uA. VCO frequency range: the VCO frequency range have been re-specified to 64-128MHz instead of 40-128MHz.
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Deviations from DC/AC specification
ST10F276E, ST10F275E, ST10F273E
4
Deviations from DC/AC specification
DC Parameters
The devices are in line with the specifications.
AC Timings
One limitation have been found:
TLOCK: PLL Lock-in time for x10 multiplication factor is 300us instead of 250us.
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ST10F276E, ST10F275E, ST10F273E
Revision history
5
Revision history
Table 5.
Date March 2004
Revision history
Revision 1 First Issue. Added FLASH.7 and IOV2 items. Modified FLASH.1 and FLASH.6 items. Added AC deviation on parameter TLOCK in section Deviations from DC/AC specifications. Applied latest "Document Format Standards". Added XSSC.1 and XASC.1 items. Added ADC.1 item. Added information for the CDA silicon version. Created Section 4 - Documentation Update. Moved items FLASH.3 and PWRDN.3 to Section 4. Updated to include CEA and CEG versions. Updated Section 4: reference documents have new versions. Updated revision history table for Revision 4 to highlight Section 4 creation. Added Section 5: DC/AC deviations with TLOCK limitation. Added item BUS.9 - Spurious BREQ pulse in slave mode during external bus arbitration phase Added support of the ST10F275E and ST10F273E devices. Updated Chapter 4: Deviations from DC/AC specification according to final specification Added items: ADC.2 - Injected conversion stalling the ADC C-CAN.1 - Concurrent transmission requests in DAR-mode C-CAN.2 - Disabling of the transmission request Re-introduce item FLASH.1 - Read while Write not supported for all devices Description of changes
September 2004
2
September 2004
3
October 2004
4
February 2005
5
July 2005
6
05-July-2006
7
04-Sept-2007
8
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ST10F276E, ST10F275E, ST10F273E
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Document Number: 13870