ST’s rad-hard LVDS series includes 400 Mbit/s LVDS drivers, receivers and multiplexers, all with a very large input common-mode range from -4 V to +5 V, able to withstand ESD up to 8 kV.
Using ST’s 0.13 µm pure CMOS technology, this series offers enhanced performances including extended absolute maximum ratings.
All devices are cold spare and fail-safe. Radiation tests demonstrate they sustain up to 300 krad (Si) in total ionization dose, they are single-event latch-up free up to 135 MeV.cm²/mg and have best-in-class single-event transient behavior, thus meeting the requirements of satellite applications. QML-V qualification is in progress.