IEDM 2021 – 67th International Electron Devices Meeting
DATE: 11-15 December, in-person conference
Join ST at IEDM 2021! The conference this year includes 38 technical sessions with over 200 speakers. ST's experts will talk about innovations in the areas of Silicon Photonics, FD-SOI and image sensors.
The “1.62µm Global Shutter Quantum Dot Image Sensor Optimized for Near and Shortwave Infrared” paper presented by J. Steckel was highlighted by IEDM official conference press release in August.
|Date||Time (PST)|| |
|Speaker or co-authors|
|Dec. 14||9:05 am|| |
|O. Weber, A. Villaret, E. Vandenbossche, F. Arnaud, E. Bernard, S. Elghouli, C. Boccaccio, L. Favennec, R. Gonella, J. Galvier (ST co-authors)|
|Dec. 14||4:00 pm|| |
|J. Steckel (ST presenter)|
|Dec. 15||9:05 am|| |
paper. ePCM reliability, considering retention and endurance, is characterized. The key role played by Heater is demonstrated. Finally, TiSiN ALD deposition process is proposed as the solution to improve uniformity and scalability of Heater resistance.
|R. Ranica (ST presenter)|
|Dec. 15||9:30 am|| |
Session 29-2 - INVITED
|F. Boeuf (ST presenter)|