On-demand Webinar: Histogram-based ToF Sensors

Discover how ST's third generation of FlightSense Time-of-Flight sensors use histogram architecture to improve ranging distance and enable multi-object detection



Watch the 1-hour, on-demand webinar to learn the fundamentals of time-of-flight (ToF) technology and what you need to develop a high-performance ranging system.

The session will teach you how to evaluate a time-of-flight system and determine if it is the right solution for your application. We will then show you how to optimize the performance of your time-of-flight design, and introduce you to the newest additions to ST's ToF portfolio, the VL53L3CX and VL53L1CB.

You will learn:

  • The basics of time-of-flight technology
  • How histograms are used to enable time-of-flight distance measurement
  • The advanced features and capabilities of ST's newest histogram-based ToF sensors

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John Kvam is a Field Applications Engineer at STMicroelectronics. With over 40 years of experience in the development of software and sensors, he has worked in the fields of signal analysis, satellite communication, digital TV, and real-time applications. For the last few years John has dedicated his career to making Time-of-Flight a reality. He is ST’s first technical point of contact for applications such as laser-assisted autofocus, object detection, and ranging.