IEEE MEMS 2022
IEEE MEMS 2022
Date: 9-13 January – Tokyo and online (hybrid format)
Check out the conference program and register now!
Go to the IEEE MEMS website
The 35th IEEE International Conference on Micro Electro-Mechanical Systems (IEEE MEMS) is one of the premier annual events reporting research results on all scientific aspects of micro/nanoscale devices, micro/nano-systems, as well as their relevant technologies and industrial trends. This conference brings together the nanotechnology research communities to discuss the latest successful advancements in MEMS.
STMicroelectronics confirms its Gold sponsorship for the 2022 edition and we are contributing with multiple authoritative research papers, both presented and co-authored and with an additional presentation. Check out the list below to find our innovations! This year’s edition will be held in a hybrid format from Tokyo. Save the date and start the new year with MEMS!
| Date | Time (JST) | Title | Speakers |
| 11 Jan | 22:00 23:30 | Virtual Poster session 3B Emerging Technologies and New Opportunities for MEMS/NEMS Nonlinear Dynamics in MEMS/NEMS 305 – Fast and accurate predictions of MEMS micromirrors nonlinear dynamic response using direct computation of invariant manifolds | Nicolò Boni, Roberto Carminati, Gianluca Mendicino ST co-authors |
| 11 Jan | 22:00 23:30 | Virtual poster session III - Emerging Technologies & New Opportunities for MEMS/NEMS MEMS ScanAR: a complete display solution for augmented reality applications | Elan Roth, ST Presenter |
| 11 Jan | 22:00 23:30 | Virtual Poster session 5B Emerging Technologies and New Opportunities for MEMS/NEMS Nonlinear Dynamics in MEMS/NEMS 307 - Reduced order modeling in a MEMS arch resonator exhibiting 1:2 internal resonance | Patrick Fedeli, Paola Carulli ST co-authors |
| 12 Jan | 14:15 | Paper Session X Advanced Fabrication and Characterization A defect-based MEMS phononic crystal slab waveguide | Luca Falorni, ST co-authors |
| 12 Jan | 22:00 23:30 | Virtual Poster session 5C Industry MEMS and Advancing MEMS for Products and Sustainability Measurement Methods for Product Specs 510 - Electro-optical testing solution at wafer level for MEMS PZT micromirrors actuation and mechanical angle sensing | Alessandro Della Bitta, ST presenter |
| 12 Jan | 22:00 23:30 | Virtual Poster session 5F MEMS Physical Sensors Inertial Sensors 521 – Thelma-Double: a new technology platform for manufacturing of high-performance MEMS inertial sensors | Federico Vercesi, ST presenter |
| 13 Jan | 11:15 | Paper Session XIII - Piezoelectric Devices Efficient phase and quadrature control of a PZT resonant MEMS microscanner with piezoresistive position sensor | Luca Molinari, Raffaele Enrico Furceri, Marco Zamprogno, Roberto Carminati, Nicolò Boni ST co-authors |
