ST’s rad-hard LVDS series includes 400 Mbit/s LVDS drivers, receivers, serializers/deserializers and cross-point switches featuring a very large input common-mode range from –4 to +5 V, able to withstand ESD up to 8 kV . They all support cold-sparing and ensure fail-safe operation.

Designed using ST radiation-hardening design rules and manufactured using ST’s proven CMOS technology, they can withstand up to 300 krad (Si) total ionization dose (TID). Immune to single-event latch-up (SEL) up to 135 MeV.cm²/mg, our rad-hard LVDS series ensures best-in-class single-event transient behavior, thus meeting the requirements of satellite applications.

Our LVDS series is available in hermetic ceramic packages and meets the most stringent radiation immunity standards and qualification criteria to be included in QML-V and EPPL lists.

QLM-V qualified LVDS serializer/deserializer for high-speed serial communications

With our new RHFLVDS217, an LVDS serializer, and the RHFLVDS218, an LVDS de-serializer, a 21-bit wide CMOS/TTL data bus can be brought onto three LVDS data streams compliant with the ANSI/TIA/EIA-644 standard. Thanks to the wide common-mode range available for LVDS analog lines, board-to-board high speed communication can be easily integrated into any satellite design.

Other benefits include:

·        Cold sparing and fail-safe on all pins

·        Support for 15 to 75 MHz shift clock

·        Up to 1.575 Gbit/s throughput with up to 197 Mbyte/s bandwidth

·        325 mV (typ.) LVDS swing with –4 to +5 V input common-mode range

·        8 kV ESD (HBM) on LVDS I/Os

·        < 216 µA consumption in power-down mode

·        Integrated PLL requiring no external components

·        Total Ionization Dose (TID) > 300 krad (Si)

Latch-up immunity (LET) > 120 MeV.cm²/mg (according to MIL-STD-883 method 1019)