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- CMOS F8H automotive EEPROM cycling endurance and data retention
- Comparing the M24C64-R, M24C64-F and M24C64-W devices to the M24LR64-R dual interface EEPROM
- Cycling endurance and data retention of high density EEPROM based on CMOS F8H process
- Embedded ECC in F8H process automotive EEPROM: device architecture and related application guidelines
- How a designer can make the most of STMicroelectronics Serial EEPROMs