Leveraging its proprietary trench field-stop technology, ST offers bare die IGBTs for custom designs. For automotive products, the availability of KGD (known good die) testing equipment ensures a high degree of reliability and quality thanks to extensive testing and inspection.
ST’s KGD testing includes:
- Die traceability (wafer lot, wafer number, die positioning inside wafer, and datalog)
- Top side and back side 100% visual inspection
- 100% coverage of datasheet in terms of testing
ST is also available to create new IGBT die form products on request.
The bare die IGBTs are available in different packing options, such as wafers on sticky foil or sealed die in Tape & Reel.