AN4299 · Application noteHow to improve conducted noise robustness for touch sensing applications on STM32 MCUs
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STM32303E-EVAL board example

Firmware

The firmware used with the STM32303E-EVAL is the STM32F303_Ex01_2TKeys_EVAL and it belongs to the STM32F3xx STMTouch library. The results provided in this section are obtained with the configuration values presented in the table below.

Table 3. User configuration settings related to immunity improvements
ParameterConfiguration value
HCLK48 MHz
TSLPRM_TKEY_DETECT_IN_TH100
TSLPRM_TKEY_DETECT_OUT_TH50
TSLPRM_DEBOUNCE_DETECT2
TSLPRM_TSC_CTPH1
TSLPRM_TSC_CTPL1
TSLPRM_TSC_PGPSC5
TSLPRM_TSC_USE_SS1
TSLPRM_TSC_SSD127

Performance

The performances of an STM32303E-EVAL board, with the configuration described above, are the following:

  • Acquisition performed in 1200 counts
  • Acquisition duration: 4.7 ms (target < 6.6 ms)

Conducted noise evaluation

The conducted noise evaluation results performed on the STM32303E-EVAL board according to IEC61000-4-6 standard is above 3 Vrms class A,

with the following test conditions:

  • Frequency range from 150 kHz to 80 MHz
  • 1 % frequency steps
  • Dwell time 0.5 s

On worst case bandwidth, no false detection or loss is observed up to 4 Vrms, from 200 to 400 kHz with 100 Hz steps.

Conclusion

The touch sensing controller peripheral of the STM32 devices shows a high noise immunity level in compliance with IEC61000-4-6 standard (above 3 Vrms class A). These results can easily be reached by putting in practice the following recommendations:
  • Implement an active shield electrode and enable the active shield feature in the firmware.
  • Optimize the detection thresholds.
  • Use the debounce filter.
  • Use frequency hopping.
  • Use application filtering based on ripple, noise measurement and guard-ring or ghost detections.

Revision history

Table 4. Document revision history 
DateRevisionChanges
03-Jul-20131Initial release.
11-Jun-20142Added support for STM32L0 Series.

Updated last bullet in Section 4.1. Proposed improvement techniques.

22-Oct-20153Added support for STM32L4 Series.
14-Mar-20184Updated:
  • Figure 2. Injected signal
  • Figure 5. Data processing
Added Section1. General information.
18-Jan-20195Updated:
  • Title of the document
  • Table 1. Applicable products
22-Oct-20196Updated:
  • Table 1. Applicable products
  • Section 3
  • Section 5.1 , Section 5.2 , Section 5.5 and Section 5.6
  • Section 6 STM32303E-EVAL board example

Added:

  • Section 3.1 Sampling capacitor (Cs) voltage level without noise
  • Section 3.2 Sampling capacitor (Cs) voltage level with noise
  • Figure 9. Process flow
  • Section 5.4 to Section 5.13
11-Aug-20217Updated the Applicable products table.
10-Jan-20238Updated the Table 1. Applicable products in the Section Introduction to incorporate the STM32WBA series.

Updated the whole document with minor changes.

06-Mar-20249Added STM32U0 series

Updated document title

06-Dec-202410Added STM32U3 series