IRPS 2022

IEEE International Reliability Physics Symposium (IRPS)

Date: 27 - 31 March, 2022, hybrid format
Where: Hilton DFW Lakes Executive Conference Center, Grapevine, Dallas - Texas
Go to the IRPS website and register here
Schedule available here

For 60 years, the IRPS has been the premiere conference for engineers and scientists to present new and original work in the area of microelectronics reliability. Drawing participants from the United States, Europe, Asia, and all around the world, the IRPS seeks to understand the reliability of semiconductor devices, integrated circuits, and microelectronic systems, through an improved understanding of the physics of failure and the application environment. The IRPS will allow attendees to increase their knowledge and understanding of microelectronics reliability, and provide an opportunity to meet with colleagues from around the world, and grow their network. STMicroelectronics is a Gold Patron this year, presenting step forwards on microelectronics reliability with three papers, three posters, and a tutorial. Follow us at IRPS, virtually or in person in Dallas!
Conference agenda – ST sessions at IRPS
Date Time (CDT) Title     Speakers
27 March 10:30 Tutorial TUT1
Interaction of HCI, BTI and TDDB
Xavier Federspiel
ST speaker (in person)
29 March 4:05 Session 4B.3
New Modelling Off-state TDDB for 130nm to 28nm CMOS nodes
Mahamadou Tidjani GARBA SEYBOU
ST speaker (recorded)
29 March 4:30 Session 4C.3
New Method to Perform TDDB Tests for Hybrid Bonding Interconnects
Bassel Ayoub
ST speaker (recorded)

30 March
6am-9pm Poster Session P.19
Failure Analysis of AlGaN/GaN Power HEMTs through an innovative sample preparation approach
Rosa Lucia Torrisi
ST speaker (recorded)
30 March 6am-9pm Poster Session P.25
Frequency dependant gate oxide TDDB model
Melissa Arabi
ST speaker (recorded)
30 March 6am-9pm Poster Session P.61
Failure analysis addressing method of optically undetected defectivity on 4H-SiC PowerMOSFET epitaxial layer
Francesco Cordiano
ST speaker (in person)