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IRPS 2025

March 30 - April 3, 2025 in Monterey, US

Powering the future of reliable microelectronics.
3 Expert insights. workshops.
10+ Network. experts on site.
10 On stage. presentations & invited talks.

Enabling reliable solutions for a connected world

Join ST at the 2025 IEEE International Reliability Physics Symposium (IRPS), the premiere conference for engineers and scientists to present new and original work in microelectronics reliability.

 

ST is proud to be a gold patron of the 2025 IEEE IRPS edition. Our commitment is further demonstrated by our key leaders who hold various committee roles: Lorenzo Cerati (ESD & latch-up), Fiorella Pozzobon (Reliability testing), Xavier Federspiel (Publicity chair + management comittee), Philippe Roche (Radiation track + management committee).

 

Discover our agenda below and join our experts onsite

Workshops and invited talks

Join ST leaders for insights on ePCM reliability, corrosion in microelectronics, SiC power technologies, and reliability in power packaging.

1.5h

Workshop | Lorenzo Cerati

ESD and reliability worlds: analogies and differences

1h

Workshop | Andrea Redaelli

Ge-GST ePCM reliability: an intimate interaction between material properties and device operation

1h

Workshop | Lucile Broussous

Corrosion in µ-electronic devices: an overview from FE manufacturing to product-life & reliability

30 min

Invited talk | Nicolo Piluso

Influence of starting material on final device in SiC power technologies

30 min

Invited talk | Riccardo Villa

A comprehensive reliability approach to heterogeneous integration in power packaging

Presentations and posters

Join ST speakers for insightful presentations and posters.

30 min

Presentation | Luca Oldani

Hot-hole gate current and degradation in n-type lateral drift MOSFETs: characterization and TCAD analysis

30 min

Presentation | Bassel Ayoub

Investigation into the moisture degradation mechanism of integrated stacks using new moisture sensor design

3h

Poster presentation | Valentin Viollet

Temperature and drift-aware high-level PCM-based array model for reliable hardware IMC design

3h

Poster presentation | Philippe Roche

Reliability qualification challenges and flow for analog qualification test vehicle

Chaired workshops

1h

Chair | Lucile Broussous

GaN power devices; reliability in application

1h

Chair | Lucile Broussous

Fundamentals of circuit aging: from devices to test chips to products

1h

Chair | Lorenzo Cerati

Future automotive mission profiles for the era of software-defined vehicles

1h

Chair | Philippe Roche

Microcircuit reliability management in space ESA missions: from system perspectives down to the EEE component

1h

Chair | Lorenzo Cerati

ESD and latchup

Register for IRPS 2025

Join ST experts at the 2025 IEEE IRPS and explore the advancements in microelectronics reliability!

日付

2025年 03月 30日 - 04月 03日

場所

Monterey, US

Get your pass

Hyatt Regency

Monterey, CA, US

map of IEEE IRPS map of IEEE IRPS Get your pass

Register for IRPS 2025

Join ST experts at the 2025 IEEE IRPS and explore the advancements in microelectronics reliability!

2025年 03月 30日 - 04月 03日

Monterey, US

map of IEEE IRPS Get your pass