Enabling reliable solutions for a connected world
Join ST at the 2025 IEEE International Reliability Physics Symposium (IRPS), the premiere conference for engineers and scientists to present new and original work in microelectronics reliability.
ST is proud to be a gold patron of the 2025 IEEE IRPS edition. Our commitment is further demonstrated by our key leaders who hold various committee roles: Lorenzo Cerati (ESD & latch-up), Fiorella Pozzobon (Reliability testing), Xavier Federspiel (Publicity chair + management comittee), Philippe Roche (Radiation track + management committee).
Discover our agenda below and join our experts onsite
Workshops and invited talks
Join ST leaders for insights on ePCM reliability, corrosion in microelectronics, SiC power technologies, and reliability in power packaging.
1.5h
ESD and reliability worlds: analogies and differences
1h
Ge-GST ePCM reliability: an intimate interaction between material properties and device operation
1h
Corrosion in µ-electronic devices: an overview from FE manufacturing to product-life & reliability
30 min
Influence of starting material on final device in SiC power technologies
30 min
A comprehensive reliability approach to heterogeneous integration in power packaging
Presentations and posters
Join ST speakers for insightful presentations and posters.
30 min
Hot-hole gate current and degradation in n-type lateral drift MOSFETs: characterization and TCAD analysis
30 min
Investigation into the moisture degradation mechanism of integrated stacks using new moisture sensor design
3h
Temperature and drift-aware high-level PCM-based array model for reliable hardware IMC design
3h
Reliability qualification challenges and flow for analog qualification test vehicle
Chaired workshops
1h
GaN power devices; reliability in application
1h
Fundamentals of circuit aging: from devices to test chips to products
1h
Future automotive mission profiles for the era of software-defined vehicles
1h
Microcircuit reliability management in space ESA missions: from system perspectives down to the EEE component
1h
ESD and latchup
Register for IRPS 2025
Join ST experts at the 2025 IEEE IRPS and explore the advancements in microelectronics reliability!
日付
2025年 03月 30日 - 04月 03日
場所
Monterey, US
Register for IRPS 2025
Join ST experts at the 2025 IEEE IRPS and explore the advancements in microelectronics reliability!
2025年 03月 30日 - 04月 03日
Monterey, US
Get your pass