IRPS 2025
March 30 - April 3, 2025 in Monterey, US
Powering the future of reliable microelectronics.
3 Expert insights. workshops.
10+ Network. experts on site.
10 On stage. presentations & invited talks.
Enabling reliable solutions for a connected world
Join ST at the 2025 IEEE International Reliability Physics Symposium (IRPS), the premiere conference for engineers and scientists to present new and original work in microelectronics reliability.
ST is proud to be a gold patron of the 2025 IEEE IRPS edition. Our commitment is further demonstrated by our key leaders who hold various committee roles: Lorenzo Cerati (ESD & latch-up), Fiorella Pozzobon (Reliability testing), Xavier Federspiel (Publicity chair + management comittee), Philippe Roche (Radiation track + management committee).
Discover our agenda below and join our experts onsite
Workshops and invited talks
Join ST leaders for insights on ePCM reliability, corrosion in microelectronics, SiC power technologies, and reliability in power packaging.
1.5h
Workshop | Lorenzo Cerati at | 1.5h
ESD and reliability worlds: analogies and differences
1h
Workshop | Andrea Redaelli at | 1h
Ge-GST ePCM reliability: an intimate interaction between material properties and device operation
1h
Workshop | Lucile Broussous at | 1h
Corrosion in µ-electronic devices: an overview from FE manufacturing to product-life & reliability
30 min
Invited talk | Nicolo Piluso at | 30 min
Influence of starting material on final device in SiC power technologies
30 min
Invited talk | Riccardo Villa at | 30 min
A comprehensive reliability approach to heterogeneous integration in power packaging
Presentations and posters
Join ST speakers for insightful presentations and posters.
30 min
Presentation | Luca Oldani at | 30 min
Hot-hole gate current and degradation in n-type lateral drift MOSFETs: characterization and TCAD analysis
30 min
Presentation | Bassel Ayoub at | 30 min
Investigation into the moisture degradation mechanism of integrated stacks using new moisture sensor design
3h
Poster presentation | Valentin Viollet at | 3h
Temperature and drift-aware high-level PCM-based array model for reliable hardware IMC design
3h
Poster presentation | Philippe Roche at | 3h
Reliability qualification challenges and flow for analog qualification test vehicle
Chaired workshops
1h
Chair | Lucile Broussous at | 1h
GaN power devices; reliability in application
1h
Chair | Lucile Broussous at | 1h
Fundamentals of circuit aging: from devices to test chips to products
1h
Chair | Lorenzo Cerati at | 1h
Future automotive mission profiles for the era of software-defined vehicles
1h
Chair | Philippe Roche at | 1h
Microcircuit reliability management in space ESA missions: from system perspectives down to the EEE component
1h
Chair | Lorenzo Cerati at | 1h
ESD and latchup
Register for IRPS 2025
Join ST experts at the 2025 IEEE IRPS and explore the advancements in microelectronics reliability!
On
Mar 30 - Apr 03, 2025
In
Monterey, US
Register for IRPS 2025
Join ST experts at the 2025 IEEE IRPS and explore the advancements in microelectronics reliability!
Mar 30 - Apr 03, 2025
Monterey, US
Get your pass 